The energy dispersive X-ray diffraction method: annotated bibliography 1968–78

Author:

Laine E.,Lähteenmäki I.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference112 articles.

1. B. Buras, J. Chwaszczewska, S. Szarras andZ. Szmid, “Fixed Angle Scattering (FAS) Method for X-ray Crystal Structure Analysis”,Inst. Nucl. Res. (Warsaw), Rep. No. 894/II/PS (1968) 10 pp. Described the EDXRD method and gives a formula for integrated intensity. Applications were also considered. This and following paper [2] reported the first work on EDXRD.

2. B. C. Giessen andG. E. Gordon, “X-ray Diffraction: New High-Speed Technique Based on X-ray Spectrography”,Science 159 (1968) 973. Described and discussed the EDXRD method. Diffraction patterns of platinum sheet were reported. See also [1].

3. P. J. Freud andP. N. Lamori, “Non-Dispersive High Pressure High Temperature X-ray Diffraction Analysis”,Trans. Amer. Cryst. Assoc. 5 (1969) 155. Described a high pressure apparatus and discussed the use of the EDXRD method in high pressure measurements. Measurements on iron and NaCl were made at about 2.5 GPa pressure.

4. H. Cole, “Bragg's Law and Energy Sensitive Detectors”,J. Appl. Cryst. 3 (1970) 405. Considered theoretically Bragg's law and energy and angle dispersive diffraction methods. An expression for the power per unit length of diffracted cone for a flat powder sample is given in the case of EDXRD.

5. J. I. Drever andR. W. Fitzgerald, “Fluorescence Elimination in X-ray Diffractometry with Solid State Detectors”,Mater. Res. Bull. 5 (1970) 101. Discussed the use of solid state detectors in angle dispersive diffractometry. The energy resolution of solid state detectors was sufficient to discriminate the fluorescence of sample and to eliminate the need for a Kβ filter. The peak-to-background ratio was higher than in the case of the conventional counters.

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