1. A. G. Serkin, I. P. Miroshnichenko, I. A. Parinov, and E. V. Rozhkov, “Experimental device for studying defect formation is strip high-temperature superconductors,” Metallurg, No. 7, 77–78 (2006).
2. I. P. Miroshnichenko, A. G. Serkin, and V. P. Sizov, “Introduction of interference measurement technology into studying potential materials and objects,” Proc. 12th Int. Conf. Contemporary Problems of Solid Mechanics, Rostovon-Don, December 1–4, 2008.
3. V. E. Alekhin, I. P. Miroshnichemko, A. G. Serkin, and V. P. Sizov, RF Patent 2343402, MPK. G01B9/00, “Optical device for measuring object surface displacement,” Publ. 01.10.2009, Byull., No 1.
4. V. E. Alekhin, I. P. Miroshnichemko, A. G. Serkin, and V. P. Sizov, RF Patent 2343403, MPK. G01B9/00, “Method for recording displacements by optical transducer,” Publ. 01.10.2009, Byull., No. 1.
5. I. P. Miroshnichenko, I. A. Parinov, E. V. Rozhkov, and A. G. Serkin, RF Patent 2376567, MPK G01N3/00, “Device for testing thin specimens in bending,” Publ. 12.20.2009, Byull., No. 35.