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Some binary start-up demonstration tests and associated inferential methods

Published:2013-08-30 Issue:4 Volume:66 Page:759-787
ISSN:0020-3157
Container-title:Annals of the Institute of Statistical Mathematics
language:en
Short-container-title:Ann Inst Stat Math

Author:

Balakrishnan N.,Koutras M. V.,Milienos F. S.

Publisher

Springer Science and Business Media LLC

Subject

Statistics and Probability

Link

http://link.springer.com/content/pdf/10.1007/s10463-013-0424-y.pdf

Reference46 articles.

1. Aki, S., Kuboki, H., Hirano, K. (1984). On discrete distributions of order $$k$$ k . Annals of the Institute of Statistical Mathematics, 36, 431–440.

2. Antzoulakos, D. L., Koutras, M. V., Rakitzis, A. C. (2009). Start-up demonstration tests based on run and scan statistics. Journal of Quality Technology, 41, 1–12.

3. Aston, J. A. D., Martin, D. E. K. (2005). Waiting time distributions of competing patterns in higher-order Markovian sequences. Journal of Applied Probability, 42, 977–988.

4. Balakrishnan, N., Chan, P. S. (2000). Start-up demonstration tests with rejection of units upon observing $$d$$ d failures. Annals of the Institute of Statistical Mathematics, 52, 184–196.

5. Balakrishnan, N., Koutras, M. V. (2002). Runs and Scans with Applications. New York: Wiley.

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