Test Generation: A Hierarchical Approach

Author:

Jervan G.,Ubar R.,Peng Z.,Eles P.

Publisher

Springer London

Reference18 articles.

1. Abraham JA (1986) Fault modeling in VLSI. VLSI testing. North-Holland, 1–27

2. Brahme D, Abraham JA (1984) Functional testing of microprocessors. IEEE Transactions On Computers, 33(6): 475–485

3. Bryant RE (1986) Graph-based algorithms for Boolean function manipulation. IEEE Transactions on Computers, 35(8): 667–690

4. Ghosh S, Chakraborty TJ (1991) On behavior fault modelling for digital designs. Journal of Electronic Testing: Theory and Applications, (2): 135–151

5. Giambiasi N, Santucci JF, Courbis AL, Pla V (1991) Test pattern generation for behavioral descriptions in VHDL. In: Proc. of the VHDL conference, 228–234

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance;4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008);2008-01

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