Trapped ion density distribution in the presence of He-buffer gas
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF00902978.pdf
Reference13 articles.
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4. W.Neuhauser, M.Hohenstatt, P.Toschek, H.Dehmelt: Appl. Phys.17, 123 (1978)
5. D.J.Wineland, R.E.Drullinger, F.J.Walls: Phys. Rev. Lett.40, 1639 (1978)
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