Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level-Reference-Cited by-同舟云学术

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Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

Published:1998-09 Issue:3-4 Volume:128 Page:207-213
ISSN:0026-3672
Container-title:Microchimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Hoornaert Stefaan,Treiger Boris,Valkovic Vlado,Van Grieken René

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01243051.pdf

Reference6 articles.

1. R. Dybczynski, Fresenius J. Anal. Chem.1995,352, 120.

2. R. Zeisler, R. Dekner, V. Strachnov, H. Vera Ruiz,Fresenius J. Anal. Chem. 1995,352, 14.

3. P. B. DeNee,Scanning Electron Microsc. 1978,I, 479.

4. W. J. Conover,Practical Nonparametric Statistics, Wiley, New York, 1971, Ch. 6.

5. Y. Sakamoto, M. Ishiguro, G. Kitagawa,Akaike Information Criterion Statistics, Reidel, Dordrecht, 1986, 290 pp.

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