Sound-beam topography of crystal defects

Author:

Edel H.,Bialas H.,Weis O.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Materials Science

Reference21 articles.

1. See, for example: Phonon scattering in condensed matter. In: Springer Series in Solid-State Sciences, Eisenmenger, W., La�mann, K., D�ttinger, S. (eds.), Vol. 51. Berlin, Heidelberg, New York: Springer 1984

2. Lang, A.R.: Acta Metall5, 358 (1957) (section topography); J. Appl. Phys.29, 597 (1958) and30 1748 (1959) (observation of dislocations); Acta Crystallogr.12, 249 (1959) (projection topography)

3. Tanner, B.K.: X-ray diffraction topography. Oxford: Pergamon Press 1976

4. Hildebrandt, G.: Forschr. Mineral.53, 19 (1975); J. Phys. E.15, 1140 (1982); In: R�ntgen- und Elektronenbeugung. Bartz, W.J. (ed.), Chapt. 6. Sindelfingen: Expert Verlag 1985

5. Doi, K., Minakawa, N., Motohashi, H., Masaki, N.: J. Appl. Crystallogr.4, 528 (1971);7, 59 (1974)

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