1. M. B. H. Breese, D. N. Jamieson, P. J. C. King: Materials Analysis Using a Nuclear Microprobe
(Wiley, New York 1996)
2. N. P. O. Homman, C. Yang, K. J. Malmquist: Nucl. Instr. Meth. A 353, 610 (1994)
3. C. Manfredotti, F. Fizzotti, P. Polesello, E. Vittone, M. Truccato,
A. L. Giudice, M. Jaksic, P. Rossi: Nucl. Instr. Meth. B 1333, 136–138 (1998)
4. C. Manfredotti, G. Apostolo, G. Cinque, F. Fizzotti, P. Polesello, E. Vittone,
M. Truccato, A. L. Giudice, G. Egeni, V. Rudello, P. Rossi: Diamond Relat.
Mater. 7, 742 (1998)
5. C. Manfredotti, E. Vittone, P. Polesello, F. Fizzotti, M. Jaksic,
I. Bodganovic, V. Valkovic: Scanning ion beam microscopy – a new tool for
mapping transport properties of semiconductor nuclear detectors, in
J. Duggan, I. Morgan (Eds.): CP392, Application of
Accelerators in Research and Industry (AIP, New York 1997)
pp. 705–708