Correlation between Morphological Structure and Optoelectronic Properties of Al2O3 thin layer coated silicon nanowires-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Correlation between Morphological Structure and Optoelectronic Properties of Al2O3 thin layer coated silicon nanowires

Published:2020-10-04 Issue:12 Volume:13 Page:4323-4329
ISSN:1876-990X
Container-title:Silicon
language:en
Short-container-title:Silicon

Author:

Hajjaji A.,Amri C.,Rebhi A.,Gaidi M.,Ouertani R.,Amlouk M.,Bessais B.,El Khakani M. A.

Publisher

Springer Science and Business Media LLC

Subject

Electronic, Optical and Magnetic Materials

Link

https://link.springer.com/content/pdf/10.1007/s12633-020-00730-9.pdf

Reference35 articles.

1. Kato S, Kurokawa Y, Watanabe Y, Yamada Y, Yamada A, Ohta Y, Niwa Y, Hirota M (2013) Optical assessment of silicon nanowire arrays fabricated by metal-assisted chemical etching. Nanoscale Res Lett 8:216

2. Chenxi L, Michelle PL (2009) Optical absorption enhancement in silicon nanowire arrays with a large lattice constant for photovoltaic applications. Opt Express 17:19371–19381

3. Kurokawa Y, Kato S, Watanabe Y, Yamada A, Konagai M, Ohta Y, Niwa Y, Hirota M (2012). Jpn J Appl Phys 51:11PE12-1–11PE12-4

4. Wang X, Peng K-Q, Pan X-J, Chen X, Yang Y, Li L, Meng X-M, Zhang W-J, Lee S-T (2011) High-performance silicon nanowire array photoelectrochemical solar cells through surface passivation and modification. Angew Chem Int Ed 50:9861–9865

5. Yu P, Wu J, Liu S, Xiong J, Jagadish C, Wang ZM (2016) Design and fabrication of silicon nanowires towards efficient solar cells. Nano Today 11:704–737

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP