Explicit Solution for Critical Thickness of Semicircular Misfit Dislocation Loops In Strained Semiconductors Heterostructures
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Link
http://link.springer.com/content/pdf/10.1007/s12633-015-9281-z.pdf
Reference20 articles.
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3. Matthews JW (1966) Accommodation of misfit across interface between single-crystal films of various face-centred cubic metals. Philos Mag 13:1207–1212
4. Zou J, Cockayne DJH (1996) Nucleation of semicircular misfit dislocation loops from the epitaxial surface of strained-layer heterostructure. J App Phys 79:7632–7635
5. Matthews JW, Blakeslee AE, Mader S (1976) Use of misfit strain to remove dislocations from epitaxial thin films. Thin Solid Films 33:253–266
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