Novel Negative Capacitance Appeared in all Frequencies in Au/AlCu/SiO2/p-Si/Al Structure

Author:

Ashery A.ORCID

Abstract

AbstractTo the best of our knowledge. The current work shows that negative capacitance exists at all frequencies, contrary to what is claimed in the literature, which states that negative capacitance only exists at high or low frequencies. In this paper, Au/AlCu/SiO2/p-Si/Al structure was epitaxial grown by the liquid phase epitaxial growth technique. The structural characterization was studied using an X-ray diffraction pattern. The capacitance and conductance behavior was studied using I-V and C-V measurements at various temperatures, voltages, and frequencies. Negative capacitance appears at all frequencies ranging from low to high; moreover, capacitance has both positive and negative values at all frequencies, while the conductance has positive values only in all frequencies. The current-voltage characterization was used to investigation the ideality factor, barrier height, and series resistance. The barrier height and Richard constant were estimated, through investigating the current conduction mechanism of Au/AlCu/SiO2/p-Si/Al.

Funder

No funding sourses

Publisher

Springer Science and Business Media LLC

Subject

Electronic, Optical and Magnetic Materials

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Impedance Spectroscopy and Electrical Properties of Novel Structure of Au/AlCu/SiO2/p-Si/Al;ECS Journal of Solid State Science and Technology;2024-07-01

2. Negative Dielectric Constant in Novel Structure of PA-GO Composite /MnO2/Fe3O4/n-Si;ECS Journal of Solid State Science and Technology;2024-05-01

3. An Informetric View to the Negative Capacitance Phenomenon at Interlayered Metal-Semiconductor Structures and Distinct Electronic Devices;Gazi University Journal of Science Part A: Engineering and Innovation;2023-12-31

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