Thermal Characteristics of an Aluminum Thin Film due to Temperature Disturbance at Film Edges
Author:
Publisher
Springer Science and Business Media LLC
Subject
Condensed Matter Physics
Link
http://link.springer.com/content/pdf/10.1007/s10765-014-1802-2.pdf
Reference21 articles.
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4. J.M. Hayes, M. Kuball, Y. Shi, J.H. Edgar, Raman Analysis of Single Crystalline Bulk Aluminum Nitride: Temperature Dependence of the Phonon Frequencies, in MRS Proceedings (2000), doi: 10.1557/PROC-639-G6.38
5. D.Y. Song, M. Holtz, A. Chandolu, S.A. Nikishin, E.N. Mokhov, Y. Makarov, H. Helava, Appl. Phys. Lett. 89, 021901 (2006)
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