Author:
Bodzenta Jerzy,Juszczyk Justyna,Kaźmierczak-Bałata Anna,Wielgoszewski Grzegorz
Publisher
Springer Science and Business Media LLC
Reference28 articles.
1. D.G. Cahill, K. Goodson, A. Majumdar, J. Heat Transf. 124, 223 (2002)
2. D.G. Cahill, P.V. Braun, G. Chen, D.R. Clarke, S. Fan, K.E. Goodson, P. Keblinski, W.P. King, G.D. Mahan, A. Majumdar, H.J. Maris, S.R. Phillpot, E. Pop, L. Shi, Appl. Phys. Rev. 1, 011305 (2014)
3. B. Cretin, S. Gomes, N. Trannoy, P. Vairac, Top. Appl. Phys. 107, 181 (2007)
4. L. Shi, Scanning thermal and thermoelectric microscopy, in Handbook of Microscopy for Nanotechnology, ed. by N. Yao, Z.L. Wang (Kluwer Academic Publishers, New York, 2005), pp. 183–205
5. L. Shi, A. Majumdar, Micro-nano scale thermal imaging using scanning probe microscopy, in Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques, vol. I, part II, ed. by B. Bhushan, H. Fuchs, M. Tomitoti (Springer, Berlin, 2008). chap. 11
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