1. O’Keefe A., Deacon D.A.: Rev. Sci. Instrum. 59, 2544 (1988)
2. Romanini D., Lehmann K.K.: J. Chem. Phys. 99, 6287 (1993)
3. W.B. Yan, Y. Chen, in Proceedings of TEMPMEKO 2004, 9th International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by D. Zvizdić, L.G. Bermanec, T. Veliki, T. Stašić (FSB/LPM, Zagreb, Croatia, 2004), pp. 657–662
4. Intercomparisons of trace water-vapor generation facilities at national standards laboratories in the USA, the United Kingdom and Japan (to be published)
5. G.M. Mitchell, V.Vorsa, R.M. Pearlstein, A.J. Lachawiec, T. Scullard, in Proceedings of the SEMI Technical Symposium: Innovations in Semiconductor Manufacturing, SEMICON West 2004 (San Jose, California, 2004), http://www.tigeroptics.com/PAGES/technology.htm