Fine-Tuning a Deconvolution Algorithm to Restore Displacement and Strain Maps Obtained with LSA-Reference-Cited by-同舟云学术

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Fine-Tuning a Deconvolution Algorithm to Restore Displacement and Strain Maps Obtained with LSA

Published:2023-10-13 Issue:9 Volume:63 Page:1509-1537
ISSN:0014-4851
Container-title:Experimental Mechanics
language:en
Short-container-title:Exp Mech

Author:

Grédiac M.^ORCID,Balandraud X.,Blaysat B.,Jailin T.,Langlois R.,Sur F.,Vinel A.

Funder

IDEX-ISITE CAP 2025

Agence Nationale de la Recherche

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Aerospace Engineering

Link

https://link.springer.com/content/pdf/10.1007/s11340-023-00997-0.pdf

Reference48 articles.

1. Fayad SS, Seidl DT, Reu PL (2020) Spatial DIC errors due to pattern-induced bias and grey level discretization. Exp Mech 60(2):249–263

2. Bomarito GF, Hochhaltera JD, Rugglesb TJ, Cannon AH (2017) Increasing accuracy and precision of digital image correlation through pattern optimization. Opt Lasers Eng 91(April):73–85

3. Shi Y, Blaysat B, Chanal H, Grédiac M (2023) Introducing virtual DIC to remove interpolation bias and process optimal patterns. Exp Mech 63(4):637–653

4. Grédiac M, Blaysat B, Sur F (2017) A critical comparison of some metrological parameters characterizing local digital image correlation and grid method. Exp Mech 57(6):871–903

5. Grédiac M, Blaysat B, Sur F (2020) On the optimal pattern for displacement field measurement: random speckle and DIC, or checkerboard and LSA? Exp Mech 60(4):509–534

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1. OpenLSA: An open-source toolbox for computing full-field displacements from images of periodic patterns;SoftwareX;2024-09

2. Towards strain gauge 2.0: Substituting the electric resistance routinely deposited on polyimide film by the optimal pattern for full‐field strain measurement;Strain;2024-08-05

3. Characterizing the measurement resolution and measurement bias of Sampling Moiré;Optics and Lasers in Engineering;2024-06

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