Differences in chemical thickness of grain and phase boundaries: an atom probe tomography study of experimentally deformed wehrlite
Author:
Funder
Division of Earth Sciences
National Science Foundation
Publisher
Springer Science and Business Media LLC
Subject
Geochemistry and Petrology,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s00269-019-01045-x.pdf
Reference55 articles.
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3. Bons PD, den Brok B (2000) Crystallographic preferred orientation development by dissolution–precipitation creep. J Struct Geol 22(11–12):1713–1722
4. Budai J, Gauddig W, Sass SL (1979) The measurement of grain boundary thickness using X-ray diffraction techniques. Philos Mag A 40(6):757–767
5. Bunton JH, Kelly TF, Gribb TT (2010) U.S. patent no. 7,683,318. U.S. Patent and Trademark Office, Washington, DC
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