Holographic bilayer/monolayer phase transitions
Author:
Publisher
Springer Science and Business Media LLC
Subject
Nuclear and High Energy Physics
Link
http://link.springer.com/content/pdf/10.1007/JHEP07(2014)043
Reference23 articles.
1. V.G. Filev, M. Ihl and D. Zoakos, A Novel (2 + 1)-Dimensional Model of Chiral Symmetry Breaking, JHEP 12 (2013) 072 [ arXiv:1310.1222 ] [ INSPIRE ].
2. I.R. Klebanov and E. Witten, Superconformal field theory on three-branes at a Calabi-Yau singularity, Nucl. Phys. B 536 (1998) 199 [ hep-th/9807080 ] [ INSPIRE ].
3. O. Ben-Ami, S. Kuperstein and J. Sonnenschein, On spontaneous breaking of conformal symmetry by probe flavour D-branes, JHEP 03 (2014) 045 [ arXiv:1310.8366 ] [ INSPIRE ].
4. S. Kuperstein and J. Sonnenschein, A New Holographic Model of Chiral Symmetry Breaking, JHEP 09 (2008) 012 [ arXiv:0807.2897 ] [ INSPIRE ].
5. M.S. Alam, V.S. Kaplunovsky and A. Kundu, Chiral Symmetry Breaking and External Fields in the Kuperstein-Sonnenschein Model, JHEP 04 (2012) 111 [ arXiv:1202.3488 ] [ INSPIRE ].
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