Measurement of thermal diffusivity using deformation gradient and phase in the photothermal displacement technique
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF02982448.pdf
Reference11 articles.
1. Balageas, D. L., Krapez. J. C. and Cielo, P., 1986, “Pulsed photothermal modeling of layered materials,”J. Appl. Phys., Vol. 59, No. 2. pp. 348–357.
2. Bayazitoglu, Y. and Ozisik, M., 1988,Elements of Heat Transfer, McGraw Hill, New York.
3. Chen, Z. and Mandelis, A., 1992, “Thermal diffusivity measurements of ultrahigh thermal conductors with use of scanning photothermal ratewindow spectrometry: Chemical-vapor-deposition diamonds,”Phys. Rev. B, Vol. 46, pp. 13526–13538.
4. Cheng, J. C. and Zhang, S. Y., 1991, “Threedimensional theory to study photothermal phenomena of semiconductors. I. Modulated optical reflectance.”J. Appl. Phys., Vol.70. No. 11, pp. 6999–7006.
5. Jeon, P. S., Lee, K. J., Yoo, J. S., Park, Y. M. and Lee, J. H., 2002, “Measurement of thermal diffusivity using deformation angle based on the photothermal displacement method,”Transactions of the KSME, B, Vol. 26, No. 2, pp. 302–309.
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