Use of FIB to Study ZDDP Tribofilms
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials
Link
http://link.springer.com/article/10.1007/s11249-018-1114-y/fulltext.html
Reference29 articles.
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3. Rubanov, S., Munroe, P.R.: Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam. J. Mater. Sci. Lett. 20(13), 1181–1183 (2001)
4. Sugiyama, M., Sigesato, G.: A review of focused ion beam technology and its applications in transmission electron microscopy. J. Electron. Microsc. 53(5), 527–536 (2004)
5. Gianuzzi, L.A.: Introduction to FIB. Springer, New York (2005)
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