Modeling background level of XRD peak profile for the variance method of size-strain analysis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
https://link.springer.com/content/pdf/10.1007/s10853-023-08966-7.pdf
Reference11 articles.
1. Sarkar A, Mukherjee P, Barat P (2008) X-ray diffraction studies on asymmetrically broadened peaks of heavily deformed zirconium-based alloys. Mater Sci Eng: A 485(1–2):176–181. https://doi.org/10.1016/j.msea.2007.07.063
2. Enzo S, Parrish W (1983) A method of background subtraction for the analysis of broadened profiles. Adv X ray Anal 27:37–44. https://doi.org/10.1154/S0376030800016931
3. Dasgupta P (2002) On the intrinsic hook effect associated with pseudo-Voigt profiles. J Appl Crystallogr 35(2):267–269. https://doi.org/10.1107/S0021889801021203
4. Langford JI (1982) The variance as a measure of line broadening: corrections for truncation curvature and instrumental effects. J Appl Crystallogr 15(3):315–322. https://doi.org/10.1107/S0021889882012047
5. Langford JI (1968) The variance and other measures of line broadening in powder diffractometry. I. Practical considerations. J Appl Crystallogr 1(1):48–59. https://doi.org/10.1107/S002188986800498X
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