Relationship between nano-architectured Ti1−x Cu x thin film and electrical resistivity for resistance temperature detectors
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s10853-016-0722-x.pdf
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5. Borges J, Martin N, Barradas NP, Alves E, Eyidi D, Beaufort MF, Riviere JP, Vaz F, Marques L (2012) Electrical properties of AlNxOy thin films prepared by reactive magnetron sputtering. Thin Solid Films 520(21):6709–6717. doi: 10.1016/j.tsf.2012.06.062
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