Low-level gallium-aluminum-arsenide (GaAlAs) diode laser irradiation (λ 830 nm) associated with and without fluoridated gel in the prevention of enamel erosion-Reference-Cited by-同舟云学术

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Low-level gallium-aluminum-arsenide (GaAlAs) diode laser irradiation (λ 830 nm) associated with and without fluoridated gel in the prevention of enamel erosion

Published:2020-08-11 Issue:3 Volume:4 Page:145-155
ISSN:2367-2587
Container-title:Lasers in Dental Science
language:en
Short-container-title:Laser Dent Sci

Author:

Seefeldt Vanessa Borelli,Alvarenga Marian Pereira,Soares Luís Eduardo Silva^ORCID

Funder

Fundação de Amparo à Pesquisa do Estado de São Paulo

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Publisher

Springer Science and Business Media LLC

Subject

General Medicine

Link

https://link.springer.com/content/pdf/10.1007/s41547-020-00100-z.pdf

Reference36 articles.

1. Lussi A, Jäggi T (2008) Erosion—diagnosis and risk factors. Clin Oral Investig 12(1):5–13

2. Imfeld T (1996) Dental erosion. Definition, classification and links. Eur J Oral Sci 104(2):151–155

3. de Melo MA, Passos VF, Alves JJ, Barros EB, Santiago SL, Rodrigues LK (2011) The effect of diode laser irradiation on dentin as a preventive measure against dental erosion: an in vitro study. Lasers Med Sci 26(5):615–621

4. Carneiro TV, Pereira IF, de Figueiredo CC, Moura MEM, Valença AMG (2013) Estudo in vitro do efeito protetor de vernizes fluoretados frente à erosão em esmalte bovino. Revista Brasileira de Ciências da Saúde 16(4):559–566

5. Shipley S, Taylor K, Mitchell W (2005) Identifying causes of dental erosion. Gen Dent 53(1):73–75 quiz 76, 71-72

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