1. Abdel-Latif, A.M., Corbett, J. M., Sidey, D. and Taplin, D. M. R., 1981, “Effects of Micro-sturctural Degradation on Creep Life Prediction of 2-1/4Cr-1Mo Steel,”Advanced in Fracture Research, (Proc. Of 5th Int. Conf. On Fracture (ICF5)), Vol. 4, pp. 1613–1620.
2. Abdel-Latif, A. M., Corbett, S. M. and Taplin, D. M. R., 1982, “Analysis of Carbides Formed During Accelerated Aging of 2.25Cr-1Mo Steel,”Metal Science, Vol. 16, pp. 90–96.
3. ASTM B193-87, 1992, “Standard Test Method for Resistivity of Electrical Conductor Materials,”Annual Book of ASTM Standard, pp. 308–311.
4. ASTM F43-93, 1993, “Standard Test Methods for Resistivity of Semiconductor Materials,”Annual Book of ASTM Standard, pp. 50–56.
5. ASTM F84-93, 1993, “Standard Test Method for Measuring Resistivity of Silicon Wafers with an In-Line Four-Point Probe,” Annual Book of ASTM Standard, pp. 135–147.