Author:
Tobin S. P.,Pultz G. N.,Krueger E. E.,Kestigian M.,Wong K. K.,Norton P. W.
Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. L.F. Lou and W.H. Frye,J. Appl. Phys. 56, 2253 (1984).
2. E. Finkman and Y. Nemirovsky,J. Appl. Phys. 53, 1052 (1982).
3. M.C. Gold and D.A. Nelson,J. Vac. Sci. Technol. A 4, 2040 (1986).
4. K.K. Parat, N.R. Taskar, I.B. Bhat and S.K. Ghandhi,J. Cryst. Growth 102, 413 (1990).
5. Standard Method for Measuring Hall Mobility and Hall Coefficient in Extrinsic Semiconductor Single Crystals, ANSI/ASTM Method F 76-73.
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