Mass spectrometry of solids ? with special emphasis on probe sampling-Reference-Cited by-同舟云学术

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Mass spectrometry of solids ? with special emphasis on probe sampling

Published:1978-05 Issue:3-4 Volume:69 Page:241-259
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Liebl Helmut

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01201730.pdf

Reference34 articles.

1. A. J. Ahearn, 11th Ann. Conf. Mass Spectrometry, ASTM E-14, San Francisco, Cal., 1963, p. 223.

2. W. M. Hickam and G. G. Sweeney, 11th Ann. Conf. Mass Spectrometry, ASTM E-14, San Francisco, Cal., 1963, p. 319.

3. R. A. Wallace and J. Roboz, 11th Ann. Conf. Mass Spectrometry, ASTM E-14, San Francisco, Cal., 1963, p. 451.

4. E. Berkey and G. H. Morrison, Mater. Sci. Center Rep. 1129 (1969), Cornell Univ., Ithaca, N. Y.

5. R. E. Honig and J. R. Woolston, Appl. Phys. Lett.2, 138 (1963).

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface Analysis Using Charged-Particle Beams;Advances in Electronics and Electron Physics;1981

2. A review of the applications to solids of the laser ion source in mass spectrometry;International Journal of Mass Spectrometry and Ion Physics;1980-07

3. SIMS instrumentation and imaging techniques;Scanning;1980

4. Methoden und Trends der Elementanalytik;Nachrichten aus Chemie, Technik und Laboratorium;1979-05

5. Neue Wege zur analytischen Charakterisierung von Reinststoffen;Fresenius' Zeitschrift f�r Analytische Chemie;1979

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