Correction to: Structural Toughness Under Noise: An Efficient No-Reference Image Distortion Assessment for Blur and Noise
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Published:2020-09-25
Issue:6
Volume:15
Page:2847-2847
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ISSN:1975-0102
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Container-title:Journal of Electrical Engineering & Technology
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language:en
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Short-container-title:J. Electr. Eng. Technol.
Author:
Jeon So-Yeong,Kim Daeyeon
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering