Polynomial Neural Network Modeling of Reactive Ion Etching Process Using GMDH Method
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/11760191_152.pdf
Reference10 articles.
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3. Kim, B., Han, S., Kim, T., Kim, B., Shim, I.: Modeling Refraction Characteristics of Silicon Nitride Film Deposited in a SiH4-NH3-N2 Plasma Using Neural Network. IEEE Transactions on Plasma Science 31(3), 317–323 (2003)
4. Han, S., Bidstrup, S., Kohl, P., May, G.: Modeling the Properties of PECVD Silicon Dioxide Films Using Optimized Back-Propagation Neural Networks. IEEE Trans. Comp. Pack. and Manufac. Part A 17(2), 174–182 (1994)
5. Ivakhnenko, A.: The Group Method of Data Handling - A Rival to Stochastic Approximation. Soviet Automat. Contr. 13(3) (1968)
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