Author:
Krenn V.,Perino G.,Rüther W.,Krenn V. T.,Huber M.,Hügle T.,Najm A.,Müller S.,Boettner F.,Pessler F.,Waldstein W.,Kriegsmann J.,Häupl T.,Wienert S.,Krukemeyer M. G.,Sesselmann S.,Tikhilov R.,Morawietz L.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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