1. SAE International. Residual stress measurement by X-ray diffraction, HS-784. vol. 2003 Edition. SAE International.
2. M. Fitzpatrick, A. Fry, P. Holdway, F. Kandil, J. Shackleton and L. Suominen, Determination of Residual Stresses by X-ray Diffraction 2002;52.
3. I.C. Noyan and J.B. Cohen, Residual Stress Measurement by Diffraction and Interpretation, 1987th ed. Springer, New York, 1987.
4. F. Valiorgue, G. Kermouche, L. Lacaille, S. Zuchiatti and J. Rech, Electrolytic polishing influence on residual stresses measurements, in Proceedings of Machines et Usinage à Grande Vitesse (MUGV) MUGV2012;2012:16–8.
5. W.J. McG Tegart, The Electrolytic and Chemical Polishing of Metals in Research and Industry, Pergamon Press, Oxford, 1956.