Author:
Koochakie Mear M. R.,Jannesary Vahid,Karimipour Vahid
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Modelling and Simulation,Signal Processing,Theoretical Computer Science,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials
Reference40 articles.
1. Giovannetti, V., Lloyd, S., Maccone, L.: Quantum metrology. Phys. Rev. Lett. 96, 010401 (2006)
2. D’Ariano, G.M., Presti, P.L., Paris, M.G.A.: Using entanglement improves the precision of quantum measurements. Phys. Rev. Lett. 87(27), 270404 (2001)
3. Paris, M.G.A.: Quantum estimation for quantum technology. Int. J. Quantum Inf. 7(supp01), 125–137 (2009)
4. D’Ariano, G.M., Paris, M.G.A., Sacchi, M.F.: Quantum tomography. Adv. Imaging Electron. Phys. 128, 206–309 (2003)
5. Gisin, N., Popescu, S.: Spin flips and quantum information for antiparallel spins. Phys. Rev. Lett. 83, 432 (1999)
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1 articles.
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