Author:
Grogger Werner,Hofer Ferdinand,Warbichler Peter,Kothleitner Gerald
Abstract
Energy-filtered transmission electron microscopy (EFTEM) can be used to acquire elemental distribution
images at high lateral resolution within short acquisition times. In this article, we present an overview
of typical problems from materials science which can be preferentially solved by means of EFTEM. In the first
example, we show how secondary phases in a steel specimen can be easily detected by recording jump ratio
images of the matrix element under rocking beam illumination. Secondly, we describe how elemental maps can
be converted into concentration maps. A Ba-Nd-titanate ceramics serves as a typical materials science example
exhibiting three different compounds with varying composition.
Publisher
Cambridge University Press (CUP)
Cited by
14 articles.
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