Characterization of microdefects in GaAs crystals with high-resolution X-ray diffractometry-Reference-Cited by-同舟云学术

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Characterization of microdefects in GaAs crystals with high-resolution X-ray diffractometry

Published:1997-02 Issue:2-4 Volume:19 Page:625-635
ISSN:0392-6737
Container-title:Il Nuovo Cimento D
language:en
Short-container-title:Nouv Cim D

Author:

Zielińska-Rohozińska E.,Słupiński T.,Gronkowski J.,Harasimowicz T.,Borowski J.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF03041025.pdf

Reference27 articles.

1. Eckstein H,Phys. Rev.,68 (1945) 120.

2. Huang K,Proc. R. Soc. London, Ser. A,190 (1947) 122.

3. Krivoglaz M. A. et al., Phys. Met. Metallogr.,7, (1959), 650;9 (1960) 641;10 (1960) 169;12 (1961) 465.

4. Krivoglaz M. A.,Theory of X-Ray and Thermal and Neutron Scattering by Real Crystals (Plenum, New York) 1969.

5. Krivoglaz M. A. andRyaboshapka K. P.,Phys. Metals. Metallogr.,16 (1963) 641. See also ref. [27].

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The point defect structure and its transformation in As-implanted ZnO crystals;Journal of Physics D: Applied Physics;2012-02-10

2. X-ray High-Resolution Diffractometry for Studies of Diffuse Scattering in Semiconductor Materials;Crystal Research and Technology;2001-10

3. Orthorhombic microdefects in Si crystals;Journal of Physics D: Applied Physics;2001-05-01

4. High-resolution characterization of microdefects by X-ray diffuse scattering;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;1999-10

5. X-ray diffuse scattering characterization of microdefects in highly Te-doped annealed GaAs crystals;Journal of Physics D: Applied Physics;1998-08-07

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