Depth profiling by ion-beam spectrometry-Reference-Cited by-同舟云学术

Depth profiling by ion-beam spectrometry

Published:1982-04 Issue:4 Volume:27 Page:183-195
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

B�rgesen P.,Behrisch R.,Scherzer B. M. U.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00619079.pdf

Reference27 articles.

1. New Uses of Ion Accelerators, ed. by J.F.Ziegler (Plenum Press, New York 1975)

2. W.-K.Chu, J.W.Mayer, M.-A.Nicolet:Backscattering Spectrometry (Academic Press, New York 1978)

3. J.Bøttiger: J. Nucl. Mat.78, 161 (1978)

4. J.S.Williams, W.Möller: Nucl. Instrum. Methods157, 213 (1978)

5. B.M.U.Scherzer, H. L.Bay, R.Behrisch, P.Børgesen, J. Roth: Nucl. Instrum. Methods157, 75 (1978)

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