Evaluation of concentration-depth profiles by sputtering in SIMS and AES-Reference-Cited by-同舟云学术

Evaluation of concentration-depth profiles by sputtering in SIMS and AES

Published:1976-01 Issue:1 Volume:9 Page:59-66
ISSN:0340-3793
Container-title:Applied Physics
language:en
Short-container-title:Appl. Phys.

Author:

Hofmann S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,General Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00901910.pdf

Reference32 articles.

1. G.K. Wehner, G.S. Anderson: In:Handbook of Thin Film Technology McGraw Hill, New York 1970, Chapter 3

2. H.E. Beske: In:Quantitative Analysis with Electron Microprobes and Secondary Ion Mass Spectrometry, ed. by E. Preuss, Ber. d. KFA Jülich, Jül-Conf.8 (1973), p.249

3. H.W.Werner: In:Quant. Analysis with EMPand SIMS, Jül-Conf.8 (1973), p. 239

4. A. Benninghoven: Appl. Phys.1, 3 (1973)

5. R.E. Weber: Res. Dev.23, 22 (1972)

Cited by 166 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Depth Profile Analysis of Molybdenum Disulfide Film by Glow Discharge Mass Spectrometry;Atomic Spectroscopy;2021-03-31

2. An advance in the use of natural resources: characterisation of the quality of impregnation of bleached alfa pulpboard by unsaturated polyester resin and evaluation of the obtained composite material’s properties;Industrial Crops and Products;2020-10

3. Depth profile study of poly(styrene) – poly(methyl methacrylate) – tetrahydrofuran coatings;Progress in Organic Coatings;2019-09

4. Unraveling atomic-level self-organization at the plasma-material interface;Journal of Physics D: Applied Physics;2017-06-28

5. The microstructure and mechanical properties of thin film Ni(Ti) nanocomposite coatings containing both oxygen and nitrogen;Surface and Coatings Technology;2016-10