1. J. Abraham, D. Gajski, “Design of Testable Structures Defined by Simple Loops,” IEEE Trans. on Comp., C-30, 1981, pp. 875–884
2. J. Abraham, E. Davidson, J. Patel, “Memory System Design for Tolerating Single-Event Upsets,” IEEE Trans. on Nuclear Science, NS-30,No. 6, 1983, pp. 4339–4344.
3. J. Abraham, G. Metze, “Roving Diagnosis for High-Performance Digital Systems,” Proc. Conf. on Information Sciences andSystems, 1978, pp. 221–226.
4. N. Alewine, K. Fuchs, W-M. Hwu, “Application of Compiler-Assisted Multiple Instruction Rollback Recovery to Speculative Execution,” Technical Report CRHC-93-16, University of Illinois, 1993.
5. Coordinated Science Laboratory Technical Report;D. Anderson,1971