New Generation of High Resolution Ultrasonic Imaging Technique for Advanced Material Characterization: Review
Publisher
Springer Netherlands
Reference20 articles.
1. A. Briggs, Acoustic microscopy, Oxford, Clarendon Press, 1992
2. R. Weglein and R. Wilson, “Characteristic material signature by acoustic microscopy”, Electron. Lett., 14, 352–354, (1978)
3. N. Nakaso, K. Ohira, M. Yanaka Y. Tsukahara, “Measurement of acoustic reflection coefficients by an ultrasonic microspectrometer”, IEEE Trans. Ultrason. Ferroelec. Freq. Contr., 41, 494–502, (1994)
4. N. Nakaso, Y. Tsukahara and N. Chubachi, “Evaluation of spatial resolution of spherical–planar–pair lenses for elasticity measurement with microscopic resolution”, IEEE Trans. Ultrason. Ferroelec. Freq. Contr., 43, 422–427, (1996)
5. O. Lobkis, D. Chimenti, “Three–dimensional transducer voltage in anisotropic materials characterization”, J. Acoust. Soc. Amer., 106, 36–45, (1999)