X-ray studies on the structure of p-(Pb1−xSnx)1−y Tey thin films-Reference-Cited by-同舟云学术

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X-ray studies on the structure of p-(Pb1−xSnx)1−y Tey thin films

Published:1991-05 Issue:10 Volume:26 Page:2595-2598
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Das S. C.,Samantaray B. K.,Bhattacherjee S.,Chaudhuri A. K.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02387723.pdf

Reference15 articles.

1. A. J. C. Wilson, “Mathematical Theory of X-ray Powder Diffractometry” (Philips Technical Library, 1963) pp. 98–102.

2. G. B. Mitra andN. K. Misra,Acta. Crystallogr. 22 (1967) 454.

3. Idem., ibid. 23 (1967) 867.

4. H. N. Acharya andN. K. Misra,J. Phys. D. App. Phys. 4 (1971) 1968.

5. N. L. P. Sinha, B. K. Samantaray, A. K. Chaudhuri andH. N. Bose,ibid. 9 (1976) 795.

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1. Secondary ion mass spectrometry characterization of matrix composition in topological crystalline insulator Pb1−xSnxTe;Thin Solid Films;2023-09

2. Photoconductivity and electrical properties of Pb1-xSnxTe thin films;Journal of Materials Science: Materials in Electronics;2001

3. Studies on layer disorder, microstructural parameters and other properties of tantalum substituted tungsten-molybdenum selenide, W0.65Mo0.35−xTaxSe2 (0≤x≤0.35);Materials Chemistry and Physics;1997-06

4. Study of layer disorder and microstructural parameters of molybdenumtungsten mixed sulpho-selenide Mo0.5W0.5S x Se2-x (0 ⩽ x ⩽ 2) by X-ray line profile analysis;Journal of Materials Science Letters;1996-01

5. Electron microscopic studies of vacuum-evaporated (Pb1 −x Sn x )1 −y Te y thin films;Bulletin of Materials Science;1993-06

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