A Computer System Measuring the Electrical Parameters of Microplasma Processes in Solutions-Reference-Cited by-同舟云学术

A Computer System Measuring the Electrical Parameters of Microplasma Processes in Solutions

Published:2005-05 Issue:3 Volume:41 Page:254-258
ISSN:0033-1732
Container-title:Protection of Metals
language:en
Short-container-title:Prot Met

Author:

Mamaev A. I.,Borikov V. N.,Mamaeva V. A.,Dorofeeva T. I.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Metals and Alloys,Organic Chemistry,Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1007/s11124-005-0037-9.pdf

Reference6 articles.

1. Mamaev, A.I., Ramazanova, Zh.M., and Savel’ev, Yu.A., RF Patent 2 046 157, Byull. Izobret., 1995, no. 29, p. 14.

2. Mamaev, A.I., Vybornova, S.N., and Mamaeva, V.A., Perspektivnye materialy, 1998, no. 6, p. 31.

3. Budnitskaya, Yu.Yu., Mamaev, A.I., Mamaeva, V.A., and Vybornova, S.N., Perspektivnye materialy, 2002, no. 3, p. 48.

4. Mamaev, A.I., Physicochemical Regularities of High-Current Pulsed Processes in Solutions on the Application of Oxide Coatings and Modification of the Surface, Doctoral (Chem.) Dissertation, Tomsk: Tomsk State University, 1999, p. 335.

5. Mamaev, A.I., Ramazanova, Zh.M., Butyagin P.I., et al., Zashch. Met., 1996, vol. 32, no.2, p. 203.

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