A single-photon fault-detection method for nanocircuits that use GaN material
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s11431-014-5463-y.pdf
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1. Efficient design method for cell allocation in hybrid CMOS/nanodevices using a cultural algorithm with chaotic behavior;Frontiers of Physics;2015-12-23
2. Different structural origins for different sized surface pits observed on a-plane GaN film;Science China Technological Sciences;2015-11-04
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