Author:
Dong YinMao,Tang DongYan,Li ChenSha
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Reference68 articles.
1. Schroder D K. Semiconductor Material and Device Characterization. New York: Wiley, 1998
2. Yang A L, Yang Y, Zhang Z Z, et al. Photoluminescence and defect evolution of nano-ZnO thin films at low temperature annealing. Sci China Tech Sci, 2013, 56: 25–31
3. Li X, Jiang Y D, Tai H L, et al. The fabrication and optimization of OTFT formaldehyde sensors based on Poly(3-hexythiophene)/ZnO composite films. Sci China Tech Sci, 2013, 56: 1877–1882
4. Howard W E. Thin Film Transistors. New York: Dekker, 2003
5. Cui J B, Soo Y C, Kandel H, et al. Investigations of ZnO thin films deposited by a reactive pulsed laser ablation. Sci China Ser E-Tech Sci, 2009, 52: 99–103
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献