Author:
Xu Ping,Cai Wei,Wang RongMing
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Reference13 articles.
1. Cretin B, Sthal F. Scanning microdeformation microscopy. Appl Phys Lett, 1993, 62(8): 829–831
2. Rabe U, Arnold W. Acoustic microscopy by atomic force microscopy. Appl Phys Lett, 1994, 64(12): 1493–1495
3. Xu P, Cai W, Yu W, et al. Application of SNAM in film deformation detection (in Chinese). J Chinese Electron Micros Soc, 2006, 25(4): 313–315
4. Yin Q R, Zeng H R, Yang Y, et al. Electron acoustic imaging and applications (in Chinese). J Chinese Electron Micros Soc, 2003, 22(4): 338–343
5. Banerjee S, Gayathri N, Shannigrahi S R, et al. Imaging distribution of local stiffness over surfaces using atomic force acoustic microscopy. J Phys D: Appl Phys, 2007, 40(8): 2539–2547
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献