A radiation-hardened-by-design technique for suppressing SET in charge pump of PLL frequency synthesizer
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/s11431-012-5086-0.pdf
Reference11 articles.
1. Boulghassoul Y, Massengill L W, Sternberg A L, et al. Towards SET mitigation in RF digital PLLs: From error characterization to radiation hardening considerations. IEEE Trans Nucl Sci, 2006, 53: 2047–2053
2. Loveless T D, Massengill L W, Bhuva B L, et al. A hardened-by-design technique for RF digital phase-locked loops. IEEE Trans Nucl Sci, 2006, 53: 3432–3438
3. Loveless T D, Massengill L W, Bhuva B L, et al. A single-event-hardened phase-locked loops. IEEE Trans Nucl Sci, 2007, 54: 2012–2020
4. Daniel T, Massengill L W, Bhuva B L, et al. A probabilistic analysis technique applied to a radiation-hardened-by-design voltagecontrolled oscillator for mixed-signal phase-locked loops. IEEE Trans Nucl Sci, 2008, 55: 3447–3455
5. Zhao Z Y, Li J F, Chen S M, et al. A radiation-hardened-by-design technique for improving single-event transient tolerance of charge pumps in PLLs. J Semicond, 2009, 30(12): 125009
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