Two improving approaches for faulty interaction localization using logistic regression analysis

Author:

Nishiura Kinari,Choi Eun-Hye,Choi Eunjong,Mizuno Osamu

Abstract

AbstractFaulty Interaction Localization (FIL) is a process to identify which combination of input parameter values induced test failures in combinatorial testing. An accurate and fast FIL provides helpful information to fix defects causing the test failure. One type of conventional FIL approach, which analyzes test results of whole test cases and estimates the suspiciousness of each combination, has two main concerns; (1) the accuracy is not enough, (2) the huge time cost is sometimes needed. In this paper, we propose two novel approaches to improve those concerns. attempts to estimate suspiciousness more accurately using logistic regression analysis. attempts to estimate failure-inducing combinations at high speed by estimating the subsets of them using logistic regression analysis and exploring just their supersets. Through evaluation experiments using a large number of artificial test results based on several real software systems, we observed that has very high accuracy, and can drastically reduce time cost for targets that have been difficult to complete by the conventional method.

Publisher

Springer Science and Business Media LLC

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3