1. F. Okuyama: Appl. Phys. A28, 125 (1982)
2. H. Oechsner:Thin Films and Depth Profile Analysis, ed. by H. Oechsner, Topics Current Phys.37 (Springer, Berlin, Heidelberg 1984) Chap. 1
3. See, for example, C. Kaito, N. Nakamura, R. Yoshida, M. Shiojiri: J. Cryst. Growth66, 156 (1984)
4. 36;L. Reimer,1984
5. P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan:Electron Microscopy of Thin Crystals (Butterworth, London 1971)