1. J.R. Laub:Adv. Mater. Processes, 1994, vol. 145, pp. 40–43.
2. C.S. Choi, E.F. Baker, and J. Orosz: inAdvances in X-ray Analysis, J.V. Gilfrich, C.C. Goldsmith, T.C. Huang, R. Jenkins, I.C. Noyan, D.K. Smith, and P.K. Predicki, eds., Plenum Press, New York, NY, 1994, vol. 37, pp. 49–57.
3. H.M. Rietveld:J. Appl. Cryst., 1969, vol. 2, pp. 65–71.
4. R. Delhez, T.H. de Keijsey, J.I. Langford, D. Louer, E.J. Mittemeijer, and E.J. Sonneveld: inThe Rietveld Method, Y.A. Young, ed., Oxford University Press, Oxford, United Kingdom, 1993, ch. 8.
5. H.P. Klug and L.E. Alexander:X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., Wiley, New York, NY, 1974.