Small-sample one-sided testing in extreme value regression models

Author:

Ferrari Silvia L. P.,Pinheiro Eliane C.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Economics and Econometrics,Social Sciences (miscellaneous),Modeling and Simulation,Statistics and Probability,Analysis

Reference30 articles.

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2. Barndorff-Nielsen, O.E.: Modified signed log likelihood ratio. Biometrika 78, 557–563 (1991)

3. Barreto-Souza, W., Vasconcellos, K.L.P.: Bias and skewness in a general extreme value regression model. Comput. Stat. Data Anal. 55(3), 1379–1393 (2011)

4. Beirlant, J., Goegebeur, Y., Segers, J., Teugels, J.: Statistics of Extremes: Theory and Applications. Wiley, Chichester (2004)

5. Castillo, E., Hadi, A.S., Balakrishnan, N., Sarabia, J.M.: Extreme Value and Related Models with Applications in Engineering and Science. Wiley, New Jersey (2005)

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