Elimination of bistability in constant-phase mode in atomic force microscopy
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://link.springer.com/content/pdf/10.1007/s11434-011-4825-0.pdf
Reference27 articles.
1. Binnig G, Quate C, Gerber C. Atomic force microscopy. Phys Rev Lett, 1986, 56: 930–933
2. Yu A F, Qi Q, Jiang P, et al. Growth related carrier mobility enhancement of pentacene thin-film transistors with high-k oxide gate dielectric. Chin Phys Lett, 2009, 26: 078501
3. Han G Q, Zeng Y G, Yu J Z, et al. Evolution of Ge and SiGe quantum dots under excimer laser annealing. Chin Phys Lett, 2008, 25: 242–245
4. Yuan S, Dong Z L, Miao L, et al. Research on the reconstruction of fast and accurate AFM probe model. Chin Sci Bull, 2010, 55: 2750–2754
5. Wang C M, Sun J L, Long F, et al. Application of image alignment and time averaging methods in AFM detection for single DNA molecules. Chin Sci Bull, 2010, 55: 1613–1618
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