High resolution scanning electron microscopy of PAN-based and pich-based carbon fibre-Reference-Cited by-同舟云学术

High resolution scanning electron microscopy of PAN-based and pich-based carbon fibre

Published:1990-08 Issue:8 Volume:9 Page:883-887
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Vezie D. L.,Adams W. W.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00722159.pdf

Reference17 articles.

1. W. W. ADAMS and R. K. EBY,MRS Bulletin 12 (1987) 22.

2. S. KUMAR, W. W. ADAMS and T. E. HELMINIAK,J. Reinf. Plast. and Comp. 7 (1988) 108.

3. M. ENDO,J. Mat. Sci. 23 (1988) 598.

4. A. FOURDEUX, R. PERRET and W. RULAND, in ?Carbon Fibres, Their Composites and Applications?, Int. Carbon Fibre Conf. (Plastics Inst., London, 1971).

5. M. GUIGONet al., in 15th Carbon Conference, Extended Abstracts (Philadelphia, 1981) p. 288.

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