1. Aritome S, Shirota R, Hemink G, Endoh T, Masuoka F (1993) Reliability issues of flash memory cells. In: Proceedings of IEEE, pp 776–788
2. Bhattacharya S et al (1996) Improved performance and reliability of split gate source side injected flash memory cells. IEDM Tech Digest, pp 339–342
3. Fitzpatrick JM, Grefenstette JJ (1988) GAs in Noisy Environments Computer Science Department, Vanderbilt University, Nashville, Tennessee 37235
4. Forrest S, Mitchell M (1993) What makes a problem hard for a genetic algorithm? Some anomalous results and their explanation. Mach Learn 13:285–319
5. Fowler RH, Nordheim L (1928) Electron emission in intense electric fields. Proc R Soc Lond A119:172–81