Author:
Bertrand Patrick,Lu-Tao Weng
Reference43 articles.
1. J. C. Vickerman, Analyst 1994, 119, 513.
2. A. Beninghoven, F. G. Rüdenauer, H. W. Werner, Secondary Ion Mass Spectrometry, Basic Concepts, Instrumental Aspects, Applications and Trends, Wiley, Chichester, 1987.
3. A. Beninghoven, Angew. Chem. Int. Ed. Engl, 1994, 33, 1023.
4. I. V. Bletsos, D. M. Hercules, D. van Leyen, B. Hagenhoff, E. Niehuis, A. Benninghoven, Anal. Chem. 1991, 63, 1959.
5. G. J. Leggett, J. C. Vickerman, Int. J. Mass Spectrom. Ion Proc. 1992, 122, 281.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献